发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To optimize the concentration profile of halogen elements of a gate insulating film or a substrate. SOLUTION: This is the manufacturing method of a semiconductor device which has a gate electrode 54 made via a gate insulating film 53 on a first conductivity semiconductor substrate 51 and second conductivity diffused layer 55 made in the regions corresponding to both ends of this gate electrode and to serve as a source and a drain. At this time, this manufacturing method has a process of forming an insulating film 56 containing halogen elements at the flank, at least of the gate electrode and a process of introducing the halogen elements contained in this insulating film into the surface region of the gate insulating film and the semiconductor substrate through heat treatment.
申请公布号 JP2000196073(A) 申请公布日期 2000.07.14
申请号 JP19980370756 申请日期 1998.12.25
申请人 TOSHIBA CORP 发明人 SATAKE HIDEKI;MITANI YUICHIRO
分类号 H01L29/78;H01L21/265;H01L21/28;H01L21/336;H01L21/8238;H01L27/092;(IPC1-7):H01L29/78;H01L21/823 主分类号 H01L29/78
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