发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To optimize the concentration profile of halogen elements of a gate insulating film or a substrate. SOLUTION: This is the manufacturing method of a semiconductor device which has a gate electrode 54 made via a gate insulating film 53 on a first conductivity semiconductor substrate 51 and second conductivity diffused layer 55 made in the regions corresponding to both ends of this gate electrode and to serve as a source and a drain. At this time, this manufacturing method has a process of forming an insulating film 56 containing halogen elements at the flank, at least of the gate electrode and a process of introducing the halogen elements contained in this insulating film into the surface region of the gate insulating film and the semiconductor substrate through heat treatment.
|
申请公布号 |
JP2000196073(A) |
申请公布日期 |
2000.07.14 |
申请号 |
JP19980370756 |
申请日期 |
1998.12.25 |
申请人 |
TOSHIBA CORP |
发明人 |
SATAKE HIDEKI;MITANI YUICHIRO |
分类号 |
H01L29/78;H01L21/265;H01L21/28;H01L21/336;H01L21/8238;H01L27/092;(IPC1-7):H01L29/78;H01L21/823 |
主分类号 |
H01L29/78 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|