发明名称 Process for generating a space in a structure
摘要 PCT No. PCT/DE96/01277 Sec. 371 Date Feb. 4, 1998 Sec. 102(e) Date Feb. 4, 1998 PCT Filed Jul. 12, 1996 PCT Pub. No. WO97/06556 PCT Pub. Date Feb. 20, 1997In a method for the production of a spacer layer in a structure in a first step a structure is produced by anisotropic dry etching, and in a further step an oxide layer is deposited with an organic silicon precursor at a pressure of p=0.2-1 bar and a temperature of 200 DEG C. to 400 DEG C.
申请公布号 US6030900(A) 申请公布日期 2000.02.29
申请号 US19980011375 申请日期 1998.02.04
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 GRASSL, THOMAS;ENGELHARDT, MANFRED
分类号 H01L21/76;C23C16/02;C23C16/40;H01L21/316;H01L21/762;(IPC1-7):H01L21/44 主分类号 H01L21/76
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