发明名称 |
Process for generating a space in a structure |
摘要 |
PCT No. PCT/DE96/01277 Sec. 371 Date Feb. 4, 1998 Sec. 102(e) Date Feb. 4, 1998 PCT Filed Jul. 12, 1996 PCT Pub. No. WO97/06556 PCT Pub. Date Feb. 20, 1997In a method for the production of a spacer layer in a structure in a first step a structure is produced by anisotropic dry etching, and in a further step an oxide layer is deposited with an organic silicon precursor at a pressure of p=0.2-1 bar and a temperature of 200 DEG C. to 400 DEG C.
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申请公布号 |
US6030900(A) |
申请公布日期 |
2000.02.29 |
申请号 |
US19980011375 |
申请日期 |
1998.02.04 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
GRASSL, THOMAS;ENGELHARDT, MANFRED |
分类号 |
H01L21/76;C23C16/02;C23C16/40;H01L21/316;H01L21/762;(IPC1-7):H01L21/44 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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