发明名称 |
METHOD FOR FABRICATING TUNGSTEN PLUG OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of forming a tungsten plug is provided to simplify process steps using low-priced slurry without metal ions in a chemical mechanical polishing process. CONSTITUTION: The method comprises the steps of forming an insulating layer on a semiconductor substrate; etching the insulating layer down to a partial top surface of the substrate to form a contact hole; forming a barrier metal layer on a surface of the contact hole and the insulating layer; forming a tungsten layer on the barrier metal layer to be buried in the contact hole in which the barrier metal layer is formed; polishing the tungsten layer and the barrier metal layer down to a top surface of the insulating layer using a chemical mechanical polishing process; oxidizing a metal layer for a plug of an outside of the contact hole to form a tungsten oxide layer; and polishing the tungsten oxide layer and the barrier metal layer.
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申请公布号 |
KR20000008433(A) |
申请公布日期 |
2000.02.07 |
申请号 |
KR19980028234 |
申请日期 |
1998.07.13 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD |
发明人 |
RYU, YEONG GYUN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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