LINE TEST CIRCUIT AND ITS METHOD,申请号JP19980133182-传众专利搜索

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发明名称	LINE TEST CIRCUIT AND ITS METHOD
摘要
申请公布号	JPH11328998(A)	申请公布日期	1999.11.30
申请号	JP19980133182	申请日期	1998.05.15
申请人	NEC CORP	发明人	SASE RYUICHI
分类号	G01R31/28;G11C29/00;G11C29/12;G11C29/56;(IPC1-7):G11C29/00	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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