发明名称 |
Method for generating random test cases without causing infinite loops |
摘要 |
A method for generating test cases for testing integrated circuits which comprises the step of apportioning a plurality of instructions into a plurality of groups of test instructions. At least some of the plurality of groups include a plurality of control flow instructions each of which transfer execution to a different one of the plurality of groups. This method prevents a test of an integrated circuit from entering an infinite loop.
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申请公布号 |
US5956478(A) |
申请公布日期 |
1999.09.21 |
申请号 |
US19950526856 |
申请日期 |
1995.09.11 |
申请人 |
DIGITAL EQUIPMENT CORPORATION |
发明人 |
HUGGINS, JAMES DWAIN |
分类号 |
G01R31/3183;G06F11/263;(IPC1-7):G06F11/263 |
主分类号 |
G01R31/3183 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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