发明名称 |
Method for etching PT film |
摘要 |
A method for etching a Pt film of the present invention includes the steps of: forming an etching resistant film on a Pt film, followed by patterning; etching the Pt film by using as an etching mask the etching resistant film and by using, as an etching gas, a mixed gas containing oxygen gas and chlorine gas or chloride gas, during which layers made of PtClxOy or a mixture containing PtClx and PtOy are formed on side walls of the etching resistant film and the Pt film; and removing the layers made of PtClxOy or the mixture containing PtClx and PtOy with an acid by wet etching after the etching step.
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申请公布号 |
US5515984(A) |
申请公布日期 |
1996.05.14 |
申请号 |
US19950377405 |
申请日期 |
1995.01.24 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
YOKOYAMA, SEIICHI;ITO, YASUYUKI;ONISHI, SHIGEO;KUDO, JUN;SAKIYAMA, KEIZO |
分类号 |
C23F1/00;C23F4/00;H01L21/02;H01L21/302;H01L21/306;H01L21/3065;H01L21/3205;H01L21/3213;H01L23/52;(IPC1-7):B44C1/22;C23F1/02 |
主分类号 |
C23F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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