发明名称 |
FABRICATING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
The method includes the steps of forming an insulating film (12) on a silicon substrate (11) to etch the film (12) to form a contact to form a first glue layer (13) thereon, forming a first metal layer (14) thereon to form a second glue layer (15) thereon, depositing an Al layer (16) on the layer (15) by sputtering, forming an insulating film (17) on the layer (16) to etch the film (17) to form a via contact to expose the film (14), filling the via contact with a selective tungsten film (18), and forming a metal layer thereon to pattern the metal layer, thereby forming the metal lines of sandwich structure to improve the contact resistance.
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申请公布号 |
KR950003222(B1) |
申请公布日期 |
1995.04.06 |
申请号 |
KR19920004017 |
申请日期 |
1992.03.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, SON - HU;PARK, YONG - UK;LEE, HYONG - KYU |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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