发明名称 FABRICATING METHOD OF SEMICONDUCTOR DEVICE
摘要 The method includes the steps of forming an insulating film (12) on a silicon substrate (11) to etch the film (12) to form a contact to form a first glue layer (13) thereon, forming a first metal layer (14) thereon to form a second glue layer (15) thereon, depositing an Al layer (16) on the layer (15) by sputtering, forming an insulating film (17) on the layer (16) to etch the film (17) to form a via contact to expose the film (14), filling the via contact with a selective tungsten film (18), and forming a metal layer thereon to pattern the metal layer, thereby forming the metal lines of sandwich structure to improve the contact resistance.
申请公布号 KR950003222(B1) 申请公布日期 1995.04.06
申请号 KR19920004017 申请日期 1992.03.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, SON - HU;PARK, YONG - UK;LEE, HYONG - KYU
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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