发明名称 |
Method and system for dividing analyzing region in device simulator. |
摘要 |
In order to divide an analyzing region in a semiconductor device into a plurality of fractional elements of a predetermined configuration, the analyzing region is initially divided into an arbitrary number of the fractional elements. With respect to a newly added nodal point, the fractional elements enclosing the new nodal point within a circumscribing range thereof are extracted as objective fractional elements for further division. Among the extracted fractional elements, specific fractional element having the perimetric fraction located within a predetermined modifying the perimeter of the fractional element group consisted of the extracted fractional elements. The fractional elements are re-establishes on the basis of the modified perimeter and the new nodal point. <IMAGE> |
申请公布号 |
EP0644496(A2) |
申请公布日期 |
1995.03.22 |
申请号 |
EP19940114632 |
申请日期 |
1994.09.16 |
申请人 |
NEC CORPORATION |
发明人 |
AKIYAMA, YUTAKA, C/O NEC CORPORATION |
分类号 |
G01R31/26;G06F17/50;G06F19/00;G06T17/20;H01L21/00;H01L21/66;H01L29/00 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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