发明名称 |
MANUFACTURE OF DIELECTRIC THIN FILM |
摘要 |
PURPOSE:To form a high-performance dielectric thin film which is provided with both of a high dielectric feature and a low leak current by accelerating ions including at least a titanium element for injecting them into a silicon thin film and by thermal-oxidizing the silicon thin film in an atmosphere including an oxygen element. CONSTITUTION:A Ti element is accelerated and injected into polycrystalline silicon 11 which also serves as an electrode to form an SiTi layer. Then, the substrate is heat-treated in an oxygen atmosphere at 200-1000 deg.C or around to form an SiTiO layer 12. At that time, care should be taken so that an Sin.; layer 13 which Ti does not reach may be formed near an interface between the polycrystalline silicon, a base, and the SiTiO layer. The SiTiO layer 12 and SiO2 layer 13 is used as a dielectric thin film 15. By this method, a dielectric thin film which is provided with not only a high dielectric feature but also a low leak current can be obtained efficiently and rationally. |
申请公布号 |
JPH04370933(A) |
申请公布日期 |
1992.12.24 |
申请号 |
JP19910148593 |
申请日期 |
1991.06.20 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KITAGAWA MASATOSHI;SHIBUYA MUNEHIRO;KAMATA TAKESHI;HIRAO TAKASHI |
分类号 |
H01G4/33;H01G4/06;H01L21/316;H01L21/822;H01L21/8242;H01L27/04;H01L27/108 |
主分类号 |
H01G4/33 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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