TEST CIRCUIT FOR LSI,申请号JP19910026998-传众专利搜索

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发明名称	TEST CIRCUIT FOR LSI
摘要
申请公布号	JPH04265874(A)	申请公布日期	1992.09.22
申请号	JP19910026998	申请日期	1991.02.21
申请人	NEC CORP	发明人	UEDA KATSU
分类号	G01R31/28;G01R31/3185	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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