Test head for electronic conductor boards

摘要

The testing device carries into its own where the grid dimensions of the holes in the conductor board are small. The holes (6) in the board are provided with sockets (11) which can be wired up and at least some of them receive a guide rod with a contact head (17). The latter is coupled mechanically with the socket through a coil spring (20) which encloses the guide rod. During testing, the contact head is in contact with the wiring of an automatic testing instrument.Alternatively, the carrier plate is made for insertion into a pneumatic testing device, whereby a pressure chamber is formed. Here, a sliding contact between two terminals is connected partially to a pneumatic supply line at the opposite end from the test head and is pressed against a sealing ring by the action of a coil spring