发明名称 METHOD OF SCREENING DISTRIBUTED FEEDBACK SEMICONDUCTOR LASER
摘要 PURPOSE:To suppress the incidence of an error floor to be small in a code error rate versus a receiving sensitivity characteristic after the transmission in a long fiber by a method wherein slope efficiencies of an optical output versus a current characteristic at the injection of respective specific electric currents are compared and screened. CONSTITUTION:There exists a strong correlation between the stability against returned light and an optical output versus an injection current characteristic when a transmission characteristic of individual elements is tested; it is possible to make a selection on the basis of the optical output versus the injection characteristic; and an element is screened as a good product in the following case: a slope efficiency of the optical output versus the current characteristic at the injection of an electric current at 1.2 times the oscillation threshold value of a distributed feedback semiconductor laser having a phase shift structure in a diffraction grating adjacent to an active layer is larger by 5% or higher as compared with a slope efficiency near the oscillation threshold value. Thereby, it is possible to suppress that an error floor is caused in a code error rate versus a receiving sensitivity characteristic after the transmission in a long fiber.
申请公布号 JPH03191588(A) 申请公布日期 1991.08.21
申请号 JP19890332087 申请日期 1989.12.20
申请人 NEC CORP 发明人 UEHARA KUNIO
分类号 H01L21/66;H01S5/00;H04B10/07;H04B10/2507;H04B10/40;H04B10/50;H04B10/60 主分类号 H01L21/66
代理机构 代理人
主权项
地址