发明名称 Method of producing a semiconductor device with total dielectric isolation
摘要 A method of producing a semiconductor device comprises the steps of preparing a stacked structure having an n--type semiconductor substrate, an n+-type diffusion layer formed on the n--type semiconductor substrate and an oxide layer formed on the n+-type diffusion layer, adhering a base substrate on the oxide layer, removing the n--type semiconductor substrate in its entirety by an etching, forming an n--type semiconductor layer on the n+-type diffusion layer to a predetermined thickness by an epitaxial growth, and forming at least an element in the n--type semiconductor layer which constitutes an active layer.
申请公布号 US5036021(A) 申请公布日期 1991.07.30
申请号 US19880259558 申请日期 1988.10.18
申请人 FUJITSU LIMITED 发明人 GOTO, HIROSHI
分类号 H01L21/74;H01L21/02;H01L21/306;H01L21/762;H01L27/12 主分类号 H01L21/74
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