Test set for the functional testing of electronic modules

摘要

The invention relates to a test set for the functional testing of electronic modules having a number of test pins (P1...), via which the connections of the electronic modules are connected to a central test controller (TK), and having a pin interface module (PA1...) on each test pin (P1...). In order to achieve a simplification of the architecture of the test set inspite of a higher test speed, each pin interface module (PA1...) for one test pin (P1...) is provided with a store (PM1...), a pin processor (PP1...) and a pin electronic unit (PE1...), with which individual test processes can be generated in each pin interface module. The invention can be applied above all in production control as well as in the functional testing of integrated electronic modules. <IMAGE>