发明名称 METHOD AND DEVICE FOR MEASURING QUALITY OF VEGITABLE AND FRUIT
摘要 <p>PURPOSE:To measure the quality of a vegitable or fruit such as saccharinity and hardness with excellent accuracy nondestructivitly by photodetecting reflected light from the vegitable or fruit to be inspected and measuring reflection intensity corresponding to >=3 kinds of different wavelength included in the near infrared-ray range. CONSTITUTION:The vegitable or fruit 3 to be inspected is irradiated with light from a light source 1 such as an infrared-ray lamp and its reflected light is photodetected by a photodetection device 4 through a spectroscope 2 and converted into an electric signal. The electric signal from the photodetection device 4 is sent to a microprocessor 9 to measure the reflection intensity of specific wavelength and the reflection factor of the wavelength is calculated to evaluate the quality according to a specific evaluation model expression. Then the reflected light from the vegitable or fruit 3 is included in the near infrared-rays range of <=3.0mum. The reflection intensity corresponding to at least three kinds of wavelengths among ranges of 0.90-1.10, 1.11-1.31, 1.24-1.44, 1.35-1.55, 1.58-1.78, and 1.72-1.92mum is measured.</p>
申请公布号 JPH01301147(A) 申请公布日期 1989.12.05
申请号 JP19880131227 申请日期 1988.05.28
申请人 MITSUI MINING & SMELTING CO LTD 发明人 KIMURA MIKIO;OKABE MASAYUKI;YASHIRO KOJI
分类号 G01N21/35;G01N21/3563;G01N21/359;G01N33/02 主分类号 G01N21/35
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