发明名称 PROCESS FOR MAKING AN IMPROVED DYNAMIC MEMORY CELL STRUCTURE
摘要 A process is provided for making a conductive structure for a semiconductor circuit, such as a one device dynamic random access memory cell, which includes the steps of depositing a conductive layer on a surface of a semiconductor substrate having a given type conductivity spaced from a storage node, depositing a layer of polysilicon over the conductive layer, depositing a layer of photoresist over the polysilicon layer, defining an opening in the photoresist layer and implanting ions of a conductivity type opposite to that of the given type conductivity through the opening and the polysilicon layer into the semiconductor substrate to form therein a conductive pocket or region having the opposite type conductivity resulting in, e.g., a highly conductive bit/sense line of a memory cell.
申请公布号 DE3572890(D1) 申请公布日期 1989.10.12
申请号 DE19853572890 申请日期 1985.06.11
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ISHAQ, MOUSA HANNA;NOBLE, WENDELL PHILLIPS, JR.
分类号 H01L27/10;H01L21/265;H01L21/3213;H01L21/8242;H01L27/108;(IPC1-7):H01L21/31;H01L21/82 主分类号 H01L27/10
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