发明名称 PROCESS AND DEVICE FOR LAMBDA-VALUE DETERMINATION AND USE OF SAME
摘要 <p>In a process for lambda-value determination, the voltages of the charged and uncharged lambda probe are determined and the internal resistance of the probe is calculated from these values using the known value of the load resistance. The value of the internal resistance and the value of the voltage of the probe in the uncharged state serve as input values for a characteristic field in which lambda-values dependent on values of the internal resistance and the voltage of the probe in the uncharged state are placed. This process for lambda-value determination has the advantage that lambda-values can be measured with high accuracy even in the strongly temperature-dependent and rich zone of a probe, for example a Nernst-type probe. The values to obtained can be displayed by a measuring instrument or used to regulate the exhaust gases from an engine, for example during run-up or at full load.</p>
申请公布号 WO1989001623(A1) 申请公布日期 1989.02.23
申请号 DE1988000504 申请日期 1988.08.18
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