发明名称 METHOD FOR COMPARING AND INSPECTING WAVEFORM
摘要 PURPOSE:To eliminate the necessity for shifting the inspection timing of a fundamental clock signal and to accurately judge the quality of a wave form, by performing comparing inspection plural times within the fundamental cycle of a 1/2 wavelength of a standard signal. CONSTITUTION:A comparator 1 compares a standard signal 2 with a signal 3 to be inspected to output a comparing signal showing coincidence or non- coincidence. A timing generating part 10 generates a signal 11 of timing A and a signal 12 of timing B from a fundamental clock signal 5. The comparing signal 9 is stored in a memory part A13 in the rising timing of the fundamental clock signal 5 and outputted as the signal 14 of this result. A memory part B15 stores the comparing signal 9 in the falling timing of the fundamental clock signal 5 to output the signal B16 of this result. At least, judge signal is obtained from the signals A14, B16 by a judge part 17 to determine the quality of the signal 3 to be inspected.
申请公布号 JPS63191079(A) 申请公布日期 1988.08.08
申请号 JP19870023020 申请日期 1987.02.02
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 NAKAJIMA FUMIO
分类号 G01R31/28 主分类号 G01R31/28
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