发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To flatten adequately the surface of a substrate using a BPSG film and to form contact diffused layers without extinguishing fine contact holes too by a method wherein the BPSG film is deposited on an insulating film, flattened by heat- treating and performing a heat treatment in a vacuum and the like are executed to the BPSG film after the contact holes are opened in the BPSG film. CONSTITUTION:An insulating film 6 is deposited on the surface of the desired semicon ductor device element part formed on a semiconductor substrate 1, a borophos phosilicate glass(BPSG)film 7 is deposited on the insulating film 6 and the BPSG film 7 is flattened by heat-treating. Then, either of the following two: a heat treatment is performed in a vacuum after contact holes 9 are opened in the BPSG film 7 and the insulating film s or the contact holes g are opened after a heat treatment is performed in a vacuum: is performed. Thereafter, a heat treatment is performed in an atmosphere of gas containing the impurity of the above semiconductor substrate. Thereby, as the concentrations of B and P in the BPSG film are reduced after the vacuum heat treatment process ends, the fusing of the BPSG film is inhibited in a reflowing process, the fine contact holes opened in the BPSG film are never extinguished and a proper reflowing form can ba obtained on the upper end pet of each contact hole.
申请公布号 JPS62235752(A) 申请公布日期 1987.10.15
申请号 JP19860079763 申请日期 1986.04.07
申请人 MATSUSHITA ELECTRONICS CORP 发明人 OZAKI HIDETO
分类号 H01L21/768;H01L21/31 主分类号 H01L21/768
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