发明名称 |
A METHOD OF MANUFACTURING A MIS TYPE SEMICONDUCTOR DEVICE |
摘要 |
In a method of manufacturing an MIS type semiconductor device, an impurity region (16 min ) is formed by implanting ions into a substrate (11) using a plurality of implantation energies and dosages, such that the peak of impurity concentration in the region does not exceed the electrically active solubility of the impurity. The impurity region (16 min ) is then irradiated by an energy beam to activate the implanted impurity (16a, 16b) without any substantial redistribution thereof. |
申请公布号 |
DE3369426(D1) |
申请公布日期 |
1987.02.26 |
申请号 |
DE19833369426 |
申请日期 |
1983.06.22 |
申请人 |
FUJITSU LIMITED |
发明人 |
YAHANO, TOSHI C/O FUJITSU LIMITED |
分类号 |
H01L21/263;H01L21/265;H01L21/268;H01L29/08;(IPC1-7):H01L21/265 |
主分类号 |
H01L21/263 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|