发明名称 MANUFACTURE OF NONVOLATILE SEMICONDUCTOR MEMORY
摘要 PURPOSE:To form a control gate having large coupling capacitance by forming the control gate inan element region through self-alignment and shaping a floating gate extending over the control gate from a section on the element region. CONSTITUTION:An Si oxide film 17 is formed onto an Si substrate 11 to which an n<+> layer 12, a mask 13 and Si oxide films 15, 17 are shaped, and the film 17 is left only o the side walls of the mask 13. P doped polycrystalline Si is deposited, and etched up to a level 21, thus obtaining a lower control gate 18. The films 17 on the side walls of the mask 13 are etched, and the gate 18 is divided into control gates 181-184. The mask 13 on the layer 12 is masked with a resist 22, and an exposed mask section is removed. The resist 22 is removed, and a gate oxide film 23 is formed. A P doped polycrystalline Si layer is shaped, and patterned to form a floating gate 24. Accordingly, large capacitive coupling is acquired under the gate 24, and the speed of rewriting time can be increased.
申请公布号 JPS6154671(A) 申请公布日期 1986.03.18
申请号 JP19840176592 申请日期 1984.08.27
申请人 TOSHIBA CORP 发明人 KIHARA HIDETAKA
分类号 H01L21/8247;H01L29/788;H01L29/792 主分类号 H01L21/8247
代理机构 代理人
主权项
地址