发明名称 Pattern features extracting apparatus and method
摘要 A plurality of different mask pattern data which are indicated by values obtained from Hermitte's polynomials of different degrees weighted by a Gaussian function are stored in mask memories, respectively. Each mask pattern data stored in each of the mask memories is convolved by a sum-of-product circuit together with unknown input pattern data. A plurality of extracted pattern feature data are stored in pattern feature memories.
申请公布号 US4543660(A) 申请公布日期 1985.09.24
申请号 US19830485061 申请日期 1983.04.14
申请人 TOKYO SHIBAURA DENKI KABUSHIKI KAISHA 发明人 MAEDA, KEN-ICHI
分类号 G06K9/80;(IPC1-7):G06K9/64 主分类号 G06K9/80
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