发明名称 TRANSFER METHOD FOR MASK PATTERN
摘要 PURPOSE:To correct a defective mask, by using masks where a prescribed pattern and a pattern, which is obtained by mirror conversion of this pattern, are formed on glass plates individually and arranging both masks so that respective patterns face to each other and transferring them. CONSTITUTION:In case that a mask 7 which has a Cr pattern 3 having a pinhole 3 or the like is corrected, a Cr mask 8 is produced where a Cr pattern 1' having a shape obtained by mirror conversion of the Cr pattern 1 of this mask 7 is formed on a glass plate 2'. Masks 7 and 8 are so arranged that surfaces of both Cr patterns 1 and 1' face to each other closely or at a proper interval, and patterns are transfered. Thus, there is a very little probability that a defect 3' is formed in the same position as the defect 3 of the pattern 1 on the Cr pattern 1'. Consequently, defects of patterns 1 and 1' are compensated and hidden by each other to make an accurate transfer possible.
申请公布号 JPS5849947(A) 申请公布日期 1983.03.24
申请号 JP19810148204 申请日期 1981.09.19
申请人 MITSUBISHI DENKI KK 发明人 KATOU TAKAAKI;WATAKABE YAICHIROU
分类号 G03F1/00;G03F1/54 主分类号 G03F1/00
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