首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
IMPROVEMENTS IN WINDOW OR THE LIKE STAYS
摘要
申请公布号
NZ179432(A)
申请公布日期
1978.12.18
申请号
NZ19750179432
申请日期
1975.12.03
申请人
INTERLOCK INDUSTRIES LTD
发明人
DAVIS R
分类号
E05D15/44;E06B
主分类号
E05D15/44
代理机构
代理人
主权项
地址
您可能感兴趣的专利
PROCESS FOR PREPARING MICROBIAL PROTEINS BY BIOTRANSFORMATION OF WASTE VEGETABLE MATTER
METHOD FOR PRODUCING A BOX PISTON
COMPONENT COMPRISED OF A COMPOSITE MATERIAL CONTAINING A FORMABLE METALLIC MATERIAL AND METHOD FOR PRODUCING THE SAME
VOLTAGE COMPENSATOR FOR SELF-CONTAINED DIRECT CURRENT SOURCES
CONICAL PLANETARY GEAR REDUCER HAVING A CENTRAL WHEEL
ANTIVIRAL, ANTIINFLAMMATORY DRUG
PROCESS FOR MANUFACTURING NOZZLES WITH MAGNESITE INSERT FOR THE CONTINUOUS CASTING INSTALLATIONS
Cooling system for liquid-cooled i.c. engine has cooling medium feed with feed and return pumps with different volumetric pumping rates and turbine driven by circulated cooling medium
Hydraulische Kraftfahrzeugbremsanlage mit Radschlupfregelung
Heat exchanger for cooling circuits comprises oval tubes joined to top containers and with tube lengthways width and holed so spaced specifically from tube end face as to prevent crushing.
Cover fixing unit, e.g. for fixing films to vehicle inner linings, comprises a guide, and edge projection, and a bending section.
UNA HERRAMIENTA PARA INSERTAR Y RETIRAR ELEMENTOS DE FIJACION UNIDIRECCIONALES, UNA HERRAMIENTA DE CENTRO DESPLAZADO PARA INSERTAR Y RETIRAR ELEMENTOS DE FIJACION UNIDIRECCIONES
Vorrichtung zur Legitimationsprüfung
VORRICHTUNG UND VERFAHREN ZUM ABBILDEN VON BITS
Elektronisches graphisches System
Automatic image acquisition with digital camera, involves changing object/lens distance to pass object through fixed focal plane, storing images, recovering image, and selecting best focused one
PARALLEL X-RAY NANOTOMOGRAPHY
Meßverfahren zur Bestimmung der ein Mikrofon kennzeichnenden Größen, wie Frequenzgang und Richtverhalten
Steuergerät für eine Brennkraftmaschine
Verfahren zum Zurückpolieren einer Wolframschicht auf einem Halbleiter-Wafer