发明名称 TANTALUM SPUTTERING TARGET AND METHOD FOR PRODUCING SAME
摘要 A tantalum sputtering target, wherein an orientation rate of a (100) plane of a sputtering surface of the tantalum sputtering target is 30 to 90%, and an orientation rate of a (111) plane of a sputtering surface of the tantalum sputtering target is 50% or less. A method of producing a tantalum sputtering target, wherein a molten tantalum ingot is subject to forging and recrystallization annealing and thereafter subject to rolling and heat treatment in order to form a crystal structure in which an orientation rate of a (100) plane of the tantalum sputtering target is 30 to 90%, and an orientation rate of a (111) plane of the tantalum sputtering target is 50% or less.;The present invention yields effects of being able to reduce the integral power consumption for burn-in of the tantalum target, easily generate plasma, stabilize the deposition rate, and reduce the resistance variation of the film by controlling the crystal orientation of the target.
申请公布号 US2016208377(A1) 申请公布日期 2016.07.21
申请号 US201514914385 申请日期 2015.03.04
申请人 JX NIPPON MINING & METALS CORPORATION 发明人 ODA Kunihiro
分类号 C23C14/34;C22F1/18;C21D9/00;C21D8/02;H01L23/532;C23C14/14;C23C14/06;H01L21/285;H01L21/768;H01J37/34;C23C8/24 主分类号 C23C14/34
代理机构 代理人
主权项 1. A tantalum sputtering target, wherein an orientation rate of a (100) plane of a sputtering surface of the tantalum sputtering target is 30 to 90%, and an orientation rate of a (111) plane of a sputtering surface of the tantalum sputtering target is 50% or less.
地址 Tokyo JP