发明名称 |
TANTALUM SPUTTERING TARGET AND METHOD FOR PRODUCING SAME |
摘要 |
A tantalum sputtering target, wherein an orientation rate of a (100) plane of a sputtering surface of the tantalum sputtering target is 30 to 90%, and an orientation rate of a (111) plane of a sputtering surface of the tantalum sputtering target is 50% or less. A method of producing a tantalum sputtering target, wherein a molten tantalum ingot is subject to forging and recrystallization annealing and thereafter subject to rolling and heat treatment in order to form a crystal structure in which an orientation rate of a (100) plane of the tantalum sputtering target is 30 to 90%, and an orientation rate of a (111) plane of the tantalum sputtering target is 50% or less.;The present invention yields effects of being able to reduce the integral power consumption for burn-in of the tantalum target, easily generate plasma, stabilize the deposition rate, and reduce the resistance variation of the film by controlling the crystal orientation of the target. |
申请公布号 |
US2016208377(A1) |
申请公布日期 |
2016.07.21 |
申请号 |
US201514914385 |
申请日期 |
2015.03.04 |
申请人 |
JX NIPPON MINING & METALS CORPORATION |
发明人 |
ODA Kunihiro |
分类号 |
C23C14/34;C22F1/18;C21D9/00;C21D8/02;H01L23/532;C23C14/14;C23C14/06;H01L21/285;H01L21/768;H01J37/34;C23C8/24 |
主分类号 |
C23C14/34 |
代理机构 |
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代理人 |
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主权项 |
1. A tantalum sputtering target, wherein an orientation rate of a (100) plane of a sputtering surface of the tantalum sputtering target is 30 to 90%, and an orientation rate of a (111) plane of a sputtering surface of the tantalum sputtering target is 50% or less. |
地址 |
Tokyo JP |