| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC tester capable of shortening a setting time of a setting value, and shortening a test time, and a control method of the IC tester. SOLUTION: This IC tester, which is acquired by improving an IC tester to be controlled by setting values by a plurality of control registers, is characterized by being provided with a plurality of slave registers for holding the setting values; a plurality of controllers for setting setting values on the slave registers when testing a test object based on execution order data showing at least setting data on which the setting values are defined and the order of execution of the setting data, and performing transfer instruction from the slave registers to the control registers during the setting time; and a test system controller for setting to the controllers by broadcast. COPYRIGHT: (C)2008,JPO&INPIT
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