| 摘要 |
PURPOSE: To remarkably reduce the input trouble of measured data and to exactly recognize the processing tendency of a working device. CONSTITUTION: By designating all product lots A to D for which the same batch processing is performed in a working device 12 when the measured data measured in a measuring device 13 is inputted and inputting the measured data of the product lot A measured by the measuring device 13 in a host computer 11 for process control, measured data is automatically written in the data file of each product lot A to D. A flag designating measured data to be the object of a statistic processing is written in the data file of an arbitrary product lot, only the measured data of the data file to which this flag is added is selected and the statistic processing is performed in the host computer 11 for process control. |
