发明名称 METHOD AND DEVICE FOR DIAGNOSING AND ANALYZING CONTROL SYSTEM
摘要 <p>PURPOSE: To provide a diagnosing and analyzing device for a control system which take a highly reliable and quantitative diagnosis by effectively utilizing data obtained from the controlled system or the control unit. CONSTITUTION: Data obtained from controllers 131-133 as the controlled system 150 or a control unit are analyzed by a signal analyzing means 102 to find fractal dimensions, a Lyapunov index, etc., which are collated by a collation diagnosing means 110 with data of the controlled system 150, etc., at normal time stored previously in a data base 107 to find dynamic abnormality by a 1st diagnosing means 104. A 2nd diagnosing means 105, on the other hand, diagnoses the secular change of the controlled system 150, etc., judging from the diagnostic result of the 1st diagnosing means. Then a 3rd diagnosing means 106 takes a total diagnosis according to the diagnosis results of the 1st diagnosing means 104 and 2nd diagnosing means 105.</p>
申请公布号 JPH08320726(A) 申请公布日期 1996.12.03
申请号 JP19950124708 申请日期 1995.05.24
申请人 HITACHI LTD 发明人 SHIKAYAMA MASAHIRO;SUGITA YOICHI;MOROOKA YASUO;INABA HIROMI;FUKUOKA SHOHEI;KUMAYAMA HARUYOSHI;KONO KIMIO
分类号 G08B31/00;G05B23/02;(IPC1-7):G05B23/02 主分类号 G08B31/00
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