| 摘要 |
PROBLEM TO BE SOLVED: To provide a configuration that has high resistance with respect to a disturbance, and can obtain a correct measurement result in an endoscope system having a three-dimensional measurement technology.SOLUTION: An endoscope system comprises: a pattern projection unit that irradiates a sample with measurement light of a predetermined wavelength band of a structured pattern for three-dimensionally measuring the sample; and a three-dimensional measurement unit that implements a three-dimensional measurement with respect to the sample in accordance with a specified measuring point on the basis of a measurement image of the sample obtained by irradiation of the measurement light. The pattern projection unit is configured to: shift a phase of a plurality of measurement light with which the sample is irradiated to a mutually different phase; arrange each of the plurality of measurement light having the phase shifted in a tip end part of the endoscope system so as to juxtapose in proximity to a predetermined direction in accordance with a shape of the structured pattern; and sequentially emit the measurement light from an emerging end corresponding to respective measurement light, and the three-dimensional measurement unit is configured to implement the three-dimensional measurement on the basis of respective measurement images obtained by the irradiation of respective measurement light.SELECTED DRAWING: Figure 1 |
