发明名称 SAMPLE BASE FOR POSITION DETECTOR
摘要 PURPOSE:To enhance the position detecting accuracy of semiconductor chip, by utilizing the fact that a frame is a magnetic material to equip an electric magnet for the compulsive removal of frame deformation. CONSTITUTION:An electric magnet constituted of an iron core 7 and coil 8 is buried in a support base 6 to form a sample base. When the frame is conducted at positioning, line of magnetic force flows through the iron core 7 and island of frame 2 as the magnetic paths to attract the island 2 to the iron core 7. As the result, the deformation of the island 2 is compulsively removed in close contact with the supprot base 6 so that the detection surface of the semicondutor chip 4 is properly opposed to the detector. Therefore, position detection is available without detection rate and decrease of detecting accuracy due to the deformation of the frame.
申请公布号 JPS57190327(A) 申请公布日期 1982.11.22
申请号 JP19810074219 申请日期 1981.05.19
申请人 TOKYO SHIBAURA DENKI KK 发明人 ICHIKAWA YOSHINORI
分类号 H01L21/68;G01B7/00;H01L21/60 主分类号 H01L21/68
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