发明名称 ELECTRODE FORMING PROCESS FOR COMPOUND SEMICONDUCTOR DEVICE
摘要 PURPOSE:To assure excellent characteristics while restraining the mutual diffusion between basic crystal and electrode metal from advancement by a method wherein an alloy comprising at least one element out of component elements of a compound semiconductor and a metal is utilized as the material for electrode. CONSTITUTION:An Si doped N type GaAs active layer 2 is grown on a substrate 1 by vapor growing process. Next a recess 6 in a gate part is formed by using a photomask and then a gate 5 is formed by using a photomask and then a gate 5 is formed by evaporation.life off process. An AlAs alloy of basic semiconductor GaAs is applicable to this gate metal. Later a source electrode 4 and a drain electrode 3 are formed using Au, Ge and Ni alloy. Finally the semiconductor device is heat-treated at the temperature of 600 deg.C for 10min to reduce the resistance of electrodes.
申请公布号 JPS61114526(A) 申请公布日期 1986.06.02
申请号 JP19840235263 申请日期 1984.11.09
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KAZUMURA MASARU;HAGIO MASAHIRO;OOTA KAZUNARI;NISHIUMA MASAHIRO
分类号 H01L21/28;H01L21/285;(IPC1-7):H01L21/285 主分类号 H01L21/28
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