发明名称 |
ELECTRODE FORMING PROCESS FOR COMPOUND SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To assure excellent characteristics while restraining the mutual diffusion between basic crystal and electrode metal from advancement by a method wherein an alloy comprising at least one element out of component elements of a compound semiconductor and a metal is utilized as the material for electrode. CONSTITUTION:An Si doped N type GaAs active layer 2 is grown on a substrate 1 by vapor growing process. Next a recess 6 in a gate part is formed by using a photomask and then a gate 5 is formed by using a photomask and then a gate 5 is formed by evaporation.life off process. An AlAs alloy of basic semiconductor GaAs is applicable to this gate metal. Later a source electrode 4 and a drain electrode 3 are formed using Au, Ge and Ni alloy. Finally the semiconductor device is heat-treated at the temperature of 600 deg.C for 10min to reduce the resistance of electrodes. |
申请公布号 |
JPS61114526(A) |
申请公布日期 |
1986.06.02 |
申请号 |
JP19840235263 |
申请日期 |
1984.11.09 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KAZUMURA MASARU;HAGIO MASAHIRO;OOTA KAZUNARI;NISHIUMA MASAHIRO |
分类号 |
H01L21/28;H01L21/285;(IPC1-7):H01L21/285 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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