| 发明名称 | Depth mapping with enhanced resolution | ||
| 摘要 | A method for depth mapping includes receiving an image of a pattern of spots that has been projected onto a scene, which includes a feature having dimensions that are less than twice an average distance between the spots in the pattern that is projected onto the feature. The image is processed so as to find a 3D location of the feature by computing three-dimensional (3D) coordinates of points on the feature based on transverse shifts of the spots in the image. The spots appearing on the feature in the 3D location are connected in order to find depth coordinates of the points on the feature with a resolution finer than a depth increment corresponding to a transverse shift equal to the average distance between the spots in the image. | ||
| 申请公布号 | US9594950(B2) | 申请公布日期 | 2017.03.14 |
| 申请号 | US201514661088 | 申请日期 | 2015.03.18 |
| 申请人 | APPLE INC. | 发明人 | Gurman Amiad |
| 分类号 | G06T19/20;G06K9/00;G06T7/00;G06K9/46;G06F3/01;G06K9/48;H04N13/02;G01B11/25;G06T15/30 | 主分类号 | G06T19/20 |
| 代理机构 | D. Kliger IP Services Ltd. | 代理人 | D. Kliger IP Services Ltd. |
| 主权项 | 1. A method for depth mapping, comprising: receiving in a digital processor an image of a pattern of spots that has been projected onto a scene, which includes a feature having a width that is less than twice an average distance between the spots in the pattern that is projected onto the feature; processing the image so as to find a 3D location of the feature by computing three-dimensional (3D) coordinates of points on the feature based on transverse shifts of the spots in the image; and connecting the spots appearing on the feature in the 3D location in order to find depth coordinates of the points on the feature with a resolution finer than a depth increment corresponding to a transverse shift equal to the average distance between the spots in the image. | ||
| 地址 | Cupertino CA US | ||