发明名称 ISOLATED SEMICONDUCTOR LAYER IN BULK WAFER BY LOCALIZED SILICON EPITAXIAL SEED FORMATION
摘要 An integrated circuit may be formed by forming a buried isolation layer in an isolation recess in a single-crystal silicon-based substrate. Exposed lateral surfaces of the substrate at the buried isolation layer are covered with a dielectric sidewall. A seed trench is formed through the buried isolation layer to expose the substrate. A single-crystal silicon-based seed layer is formed through the seed trench, extending above the top surface of the buried isolation layer. A silicon-based non-crystalline layer is formed contacting the seed layer. A cap layer is formed over the non-crystalline layer. A radiant-induced recrystallization process converts the non-crystalline layer to a single-crystal layer aligned with the seed layer. The cap layer is removed and the single-crystal layer is planarized, leaving an isolated semiconductor layer over the buried isolation layer.
申请公布号 EP3132468(A1) 申请公布日期 2017.02.22
申请号 EP20150780680 申请日期 2015.04.13
申请人 Texas Instruments Incorporated 发明人 CAROTHERS, Daniel Nelson;DEBORD, Jeffrey R.
分类号 H01L21/762 主分类号 H01L21/762
代理机构 代理人
主权项
地址