| 摘要 |
Problem to be solved: Non-destructive detection of directional and other defects in structured materials, which are concealed for the so far known detection and representation methods. The solution of the problem: The problem is solved by inclination of incidence of a beam of ionizing radiation onto the object (3) being investigated, wherein the geometry of the object (3) position, the source (2) of the ionizing radiation beam and a detector (8), including the magnitude of the angle ({alpha}) of incidence. Based on detection of an attenuated or dispersed ionizing radiation beam, there is performed image of directional defects of material with the internal structure. |
