发明名称 SRAM CELL WITH DYNAMIC SPLIT GROUND AND SPLIT WORDLINE
摘要 An SRAM cell with dynamic split ground (GND) and split wordline (WL) for extreme scaling is disclosed. The memory cell includes a first access transistor enabled by a first wordline to control access to cross coupled inverters by a first bitline. The memory cell further includes a second access transistor enabled by a second wordline to control access to the cross coupled inverters by a second bitline. The memory cell further includes a split ground line comprising a first ground line (GNDL) separated from a second ground line (GNDR). The GNDL is connected to a transistor of a first inverter of the cross coupled inverters and the GNDR is connected to a first transistor of a second inverter of the cross coupled inverters.
申请公布号 US2016155493(A1) 申请公布日期 2016.06.02
申请号 US201514963586 申请日期 2015.12.09
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 WONG Robert C.
分类号 G11C11/419 主分类号 G11C11/419
代理机构 代理人
主权项 1. A memory cell, comprising: a first access transistor enabled by a first wordline to control access to cross coupled inverters by a first bitline; a second access transistor enabled by a second wordline to control access to the cross coupled inverters by a second bitline; and a split ground line comprising a first ground line (GNDL) separated from a second ground line (GNDR), the GNDL being connected to a transistor of a first inverter of the cross coupled inverters and the GNDR being connected to a first transistor of a second inverter of the cross coupled inverters.
地址 Armonk NY US