SINGLE PARTICLE DETECTION METHOD USING SURFACE ENHANCED RAMAN SCATTERING LIGHT DETECTION

摘要

PROBLEM TO BE SOLVED: To allow a light emitting probe bonded to an observation object particle to be selectively detected even under existence of a non-reactive light emitting probe in a scanning molecule counting method by a confocal microscope or a multiphoton microscope.SOLUTION: A detection technology of an observation object particle according to the present invention is configured to: prepare a sample solution discharging Raman scattering light enhanced by a SERS phenomenon or SERRS phenomenon when a light emitting probe is bonded to the observation object particle bonded to a surface of a metal particle; generate time-series light intensity data on light detected as moving a position of a light detection area of a microscope in the sample solution and from the light detection area thereof; individually detect a time change in light intensity that has a profile assumed in the enhanced Raman scattering light from the light emitting probe bonded to the observation object particle bonded to the surface of the metal particle relatively moving in the light detection area in the time-series light intensity data as a signal of one light emitting probe; and individually detect the observation object particle.