| 摘要 |
The subject of the present invention is an electron beam analyser. m alyser for beams of electrons output, in particular, by corresponding accelerators in the form of scanning beams, characterised in that it mainly consists, on the one hand, by a network of conductors (2) which can be positioned in the scanning field (3) of the beam to analysed and, on the other hand, by an electronic device (4) for processing the electrical signals generated in the said conductors (2) of the said network under the action of the incident electron beam and, finally, by a device (5) for visual display of various characteristics of the electron beam, determined by means of the said electronic processing device (4). <IMAGE>
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