发明名称 RESISTANCE MEASUREMENT DEVICE AND CIRCUIT BOARD INSPECTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To effectively use a switch unit on each contactor side when executing a plurality of measurement processes in parallel.SOLUTION: A resistance measurement device includes a short-circuiting switch unit 5 having a switch 5a for connecting/disconnecting a low potential-side terminal Lc1 of a DC current source and a low potential-side terminal Lp1 of a voltage measurement unit in a measurement unit 3a and a switch 5b for connecting/disconnecting a low potential-side terminal Lc2 of a DC current source and a low potential-side terminal Lp2 of a voltage measurement unit in a measurement unit 3b, with a current supply path C1 for measuring a resistance value between conductor patterns xa and xb and a conductor pattern xc of a circuit board x1 and a current supply path C2 for measuring a resistance value between conductor patterns xb and xc and a conductor pattern xa of a circuit board x2 formed independently of each other inside a scanner board 4a by controlling main switch units 32a-32d and sub-switch units 33a-33d of the scanner board 4a, main switch units 32a-32d and sub-switch units 33a-33d of a scanner board 4b, and the switches 5a and 5b.</p>
申请公布号 JP2015169461(A) 申请公布日期 2015.09.28
申请号 JP20140042578 申请日期 2014.03.05
申请人 HIOKI EE CORP 发明人 BAN KAZUHIRO
分类号 G01R27/02;G01R31/02 主分类号 G01R27/02
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