| 摘要 |
FIELD: nanotechnology.SUBSTANCE: intensity of the reflection and transmission through the structure of neutrons and intensity of secondary radiation is measured, caused by the absorption of neutrons in nanolayer. Sequentially in time, three different types of dependences of density of the polarised neutrons are formed from the coordinate depthward of the test layer and from the wave vector of the neutrons, for this three-layer structure is used, located on the substrate, in which the middle layer is under study, the layer following the test one has the potential of interaction of neutrons with the substance exceeding the potential of the test layer, the layer covering the test layer is magnetic with the potential of interaction for the polarised neutrons in the direction of the vector of magnetic induction greater, and for neutrons polarised oppositely - less than the potential of interaction of the test layer.EFFECT: increase in accuracy of determining the distribution of atoms of isotopes, increase in the range of values of the thickness of the test layer.6 dwg |
