发明名称 EXPOSURE APPARATUS, EXPOSURE METHOD AND DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To accurately drive a mobile object which holds a substrate during exposure.SOLUTION: An exposure apparatus comprises: a wafer stage device 12 having a stage WST for holding a wafer W; and an encoder system including a plurality of heads (46B, 46C, 46D etc.) for irradiating beams on reflection grating parts (44B, 44C, 44D etc.), respectively, which are arranged substantially parallel with an XY plane orthogonal to an optical axis AX of a projection optical system PL, the encoder system measuring a position of the stage WST; and a control system for controlling driving of the stage WST based on measured information of the encoder system. By an exposure operation of the wafer W, a position of the stage WST is measured by the encoder system.
申请公布号 JP2015109461(A) 申请公布日期 2015.06.11
申请号 JP20150002687 申请日期 2015.01.08
申请人 NIKON CORP 发明人 SHIBAZAKI YUICHI
分类号 H01L21/027;G01B11/00;G03F7/20;H01L21/68 主分类号 H01L21/027
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