发明名称 不純物濃度を選択的に減少させたIII−V族デバイス構造
摘要 <p>There are disclosed herein various implementations of a semiconductor structure and method. The semiconductor structure comprises a substrate, a transition body over the substrate, and a group III-V intermediate body having a bottom surface over the transition body. The semiconductor structure also includes a group III-V device layer over a top surface of the group III-V intermediate body. The group III-V intermediate body has a continuously reduced impurity concentration wherein a higher impurity concentration at the bottom surface is continuously reduced to a lower impurity concentration at the top surface.</p>
申请公布号 JP5722852(B2) 申请公布日期 2015.05.27
申请号 JP20120203496 申请日期 2012.09.14
申请人 发明人
分类号 H01L21/205;C23C16/34;H01L21/338;H01L29/778;H01L29/812 主分类号 H01L21/205
代理机构 代理人
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