发明名称 |
Test apparatus |
摘要 |
A test apparatus that test a device under test, comprising a test head that is arranged facing the device under test and that includes a test module for testing the device under test, and a probe assembly that transmits a signal and that is arranged between the test head and the device under test. The probe assembly includes a plurality of low voltage pins arranged at prescribed intervals from each other, and a plurality of high voltage pins that are arranged such that distance between each high voltage pin and each low voltage pin is greater than the prescribed interval, and that transmit a signal with a higher voltage than a signal transmitted by the low voltage pins. All of the high voltage pins are arranged in only one of two regions formed by dividing a surface of the probe assembly in half. |
申请公布号 |
US8829935(B2) |
申请公布日期 |
2014.09.09 |
申请号 |
US201113118475 |
申请日期 |
2011.05.30 |
申请人 |
Advantest Corporation |
发明人 |
Sato Shusaku |
分类号 |
G01R31/20;G01R31/28;G01R1/067 |
主分类号 |
G01R31/20 |
代理机构 |
|
代理人 |
|
主权项 |
1. A test apparatus that test a device under test, comprising:
a test head that is arranged facing the device under test and that includes a test module for testing the device under test; and a probe assembly that transmits a signal and that is arranged between the test head and the device under test, wherein the probe assembly includes: a plurality of low voltage pins arranged at prescribed intervals from each other; and a plurality of high voltage pins that transmit a signal with a higher voltage than a signal transmitted by the low voltage pins, and all of the high voltage pins are arranged in only a first region of two regions formed by dividing a surface of the probe assembly in half, and a second region of the two regions only includes the plurality of low voltage pins. |
地址 |
Tokyo JP |