METHOD FOR DECREASING DEFECTS OF SILICON-CARBIDE SEED
摘要
Disclosed is a method for decreasing defects of a silicon-carbide seed. The method for decreasing defects of a silicon-carbide seed according to the present invention comprises the steps of: coating an adhesive material on one side of the silicon carbide seed; baking after filling a silicon carbide material powder in the bottom surface of the crucible and attaching the coated silicon carbide seed to the opposite surface of the powder; and thermal processing which maintains the seed cooled after the baking step at an ascended temperature for a fixed time.
申请公布号
KR101409424(B1)
申请公布日期
2014.06.19
申请号
KR20120153601
申请日期
2012.12.26
申请人
RESEARCH INSTITUTE OF INDUSTRIAL SCIENCE & TECHNOLOGY;POSCO
发明人
YEO, IM GYU;SEO, HAN SEOK;KIM, HEUNG RAK;LEE, SEUNG SEOK;EUN, TAI HEE;KIM, JANG YUL