发明名称 METHOD FOR DECREASING DEFECTS OF SILICON-CARBIDE SEED
摘要 Disclosed is a method for decreasing defects of a silicon-carbide seed. The method for decreasing defects of a silicon-carbide seed according to the present invention comprises the steps of: coating an adhesive material on one side of the silicon carbide seed; baking after filling a silicon carbide material powder in the bottom surface of the crucible and attaching the coated silicon carbide seed to the opposite surface of the powder; and thermal processing which maintains the seed cooled after the baking step at an ascended temperature for a fixed time.
申请公布号 KR101409424(B1) 申请公布日期 2014.06.19
申请号 KR20120153601 申请日期 2012.12.26
申请人 RESEARCH INSTITUTE OF INDUSTRIAL SCIENCE & TECHNOLOGY;POSCO 发明人 YEO, IM GYU;SEO, HAN SEOK;KIM, HEUNG RAK;LEE, SEUNG SEOK;EUN, TAI HEE;KIM, JANG YUL
分类号 C04B35/565;C01B31/36;C30B29/36 主分类号 C04B35/565
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