发明名称 AUTOMATIC ANALYZER
摘要 PROBLEM TO BE SOLVED: To provide an automatic analyzer which is capable of improving measurement accuracy by suppressing an influence on a measurement result of time difference in measurement between scattered light and absorbance.SOLUTION: A sample dispensing mechanism 7, reagent dispensing mechanisms 12A and 12B, agitating mechanisms 33A and 33B, a scattering photometer 40, and an absorption photometer 41 are arranged on a carrying path of reaction vessels 2 carried in a circumferential direction by rotation of a disk-shaped reaction disk 1 on which the reaction vessels 2 are juxtaposed in the circumferential direction, and it is controlled that the reaction vessels 2 are caused to pass both a scattered light detection position and transmitted light detection position which are preliminarily set on the carrying path, during the same movement process, whereby measurement of scattering light intensity and absorbance are performed.
申请公布号 JP2014020999(A) 申请公布日期 2014.02.03
申请号 JP20120161629 申请日期 2012.07.20
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 MIMURA TOMONORI;MAKINO AKIHISA;ANDO MANABU;ADACHI SAKUICHIRO
分类号 G01N21/47;G01N21/49;G01N21/59;G01N35/00 主分类号 G01N21/47
代理机构 代理人
主权项
地址