发明名称 |
CMOS active image sensor with common pixel transistors and binning capability |
摘要 |
A lock in pinned photodiode photodetector includes a plurality of output ports which are sequentially enabled. Each time when the output port is enabled is considered to be a different bin of time. A specified pattern is sent, and the output bins are investigated to look for that pattern. The time when the pattern is received indicates the time of flight A CMOS active pixel image sensor includes a plurality of pinned photodiode photodetectors that use a common output transistor. In one configuration, the charge from two or more pinned photodiodes may be binned together and applied to the gate of an output transistor.
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申请公布号 |
USRE44482(E1) |
申请公布日期 |
2013.09.10 |
申请号 |
US201213343843 |
申请日期 |
2012.01.05 |
申请人 |
BEREZIN VLADIMIR;KRYMSKI ALEXANDER I.;FOSSUM ERIC R.;ROUND ROCK RESEARCH, LLC |
发明人 |
BEREZIN VLADIMIR;KRYMSKI ALEXANDER I.;FOSSUM ERIC R. |
分类号 |
H01L31/062;G01S7/487;H01L27/146;H01L27/148;H01L31/101;H01L31/113 |
主分类号 |
H01L31/062 |
代理机构 |
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地址 |
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