发明名称 NITRIDE SEMICONDUCTOR EPITAXIAL WAFER AND NITRIDE FIELD EFFECT TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a nitride semiconductor epitaxial wafer and a nitride field effect transistor, which can inhibit current collapse.SOLUTION: A nitride semiconductor epitaxial wafer 200 comprises: an SiC substrate 101; a GaN layer 103 formed on the SiC substrate 101; and an AlGaN layer 104 formed on the GaN layer 103. The GaN layer 103 has a Wurtzite crystal structure. A ratio c/a between a grating constant c of the GaN layer 103 in a c-axis direction and a grating constant a of the GaN layer 103 in an a-axis direction is 1.6266 and under.
申请公布号 JP2013175696(A) 申请公布日期 2013.09.05
申请号 JP20120078469 申请日期 2012.03.30
申请人 HITACHI CABLE LTD 发明人 TANAKA TAKESHI;KANEDA NAOKI;NARITA YOSHINOBU
分类号 H01L21/338;C23C16/34;H01L21/205;H01L29/778;H01L29/812 主分类号 H01L21/338
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