发明名称 |
NITRIDE SEMICONDUCTOR EPITAXIAL WAFER AND NITRIDE FIELD EFFECT TRANSISTOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a nitride semiconductor epitaxial wafer and a nitride field effect transistor, which can inhibit current collapse.SOLUTION: A nitride semiconductor epitaxial wafer 200 comprises: an SiC substrate 101; a GaN layer 103 formed on the SiC substrate 101; and an AlGaN layer 104 formed on the GaN layer 103. The GaN layer 103 has a Wurtzite crystal structure. A ratio c/a between a grating constant c of the GaN layer 103 in a c-axis direction and a grating constant a of the GaN layer 103 in an a-axis direction is 1.6266 and under. |
申请公布号 |
JP2013175696(A) |
申请公布日期 |
2013.09.05 |
申请号 |
JP20120078469 |
申请日期 |
2012.03.30 |
申请人 |
HITACHI CABLE LTD |
发明人 |
TANAKA TAKESHI;KANEDA NAOKI;NARITA YOSHINOBU |
分类号 |
H01L21/338;C23C16/34;H01L21/205;H01L29/778;H01L29/812 |
主分类号 |
H01L21/338 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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