发明名称 A MEMORY DEVICE AND ELECTRONIC APPARATUS
摘要 <p>The invention provides a semiconductor device and its manufacturing method in which a memory transistor and a plurality of thin film transistors that have gate insulating films with different thicknesses are fabricated over a substrate. The invention is characterized by the structural difference between the memory transistor and the plurality of thin film transistors. Specifically, the memory transistor and some of the plurality of thin film transistors are provided to have a bottom gate structure while the other thin film transistors are provided to have a top gate structure, which enables the reduction of characteristic defects of the transistor and simplification of its manufacturing process.</p>
申请公布号 KR20130069885(A) 申请公布日期 2013.06.26
申请号 KR20137014926 申请日期 2008.06.11
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 TAKANO TAMAE;KAKEHATA TETSUYA;YAMAZAKI SHUNPEI
分类号 H01L29/786;H01L21/8247;H01L27/10;H01L27/115 主分类号 H01L29/786
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