发明名称 Plasma processing apparatus and method
摘要 A plasma processing apparatus for processing a substrate by using a plasma includes a processing chamber for accommodating and processing the substrate therein, a lower electrode for mounting the substrate thereon in the processing chamber, an upper electrode disposed to face the lower electrode in the processing chamber, a radio frequency power supply for supplying a radio frequency power to at least one of the lower and the upper electrode, to thereby generate the plasma between the lower and the upper electrode, and an electrical characteristic control unit for adjusting an impedance of a circuit at the side of an electrode to the plasma for a frequency of at least one radio frequency wave present in the processing chamber such that the circuit does not resonate.
申请公布号 US8431035(B2) 申请公布日期 2013.04.30
申请号 US20090465436 申请日期 2009.05.13
申请人 IWATA MANABU;KOSHIMIZU CHISHIO;YAMAZAWA YOHEI;TOKYO ELECTRON LIMITED 发明人 IWATA MANABU;KOSHIMIZU CHISHIO;YAMAZAWA YOHEI
分类号 H01L21/3065;B44C1/22;C23C16/00;C23C16/50;C23C16/503;C23C16/52 主分类号 H01L21/3065
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