发明名称
摘要 Provided is a plasma processing apparatus including a chamber, a lower electrode, an upper electrode, and a substrate sensor. The chamber is configured to provide a reaction space. The lower electrode is disposed at a lower region in the chamber to mount a substrate thereon. The upper electrode is disposed at an upper region in the chamber to be opposite to the lower electrode. The substrate sensor is provided on the chamber to sense the substrate. Herein, the upper electrode includes an electrode plate and an insulating plate attached on the bottom of the electrode plate, and at least one guide hole is formed in the upper electrode to guide light output from the substrate sensor toward the substrate.
申请公布号 JP5128383(B2) 申请公布日期 2013.01.23
申请号 JP20080166739 申请日期 2008.06.26
申请人 发明人
分类号 H01L21/3065 主分类号 H01L21/3065
代理机构 代理人
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