发明名称 Method for staining sample
摘要 A method for staining a sample includes the following steps. A test device is provided. The test device is sampled to obtain a sample. The sample includes a substrate, an active area disposed within the substrate and having a first doped substrate region and a second doped substrate region, at least one gate disposed between the first doped substrate region and the second doped substrate region, and an exposed shallow trench isolation embedded in the substrate and surrounding the active area. A first staining procedure is then carried out to selectively remove the shallow trench isolation to form a first void and to entirely expose the active area. A second staining procedure is subsequently carried out to selectively stain the first doped substrate region and the second doped substrate region to form a second void.
申请公布号 US8298838(B2) 申请公布日期 2012.10.30
申请号 US20100712133 申请日期 2010.02.24
申请人 CHOU PO-FU;LIU YU-WEN;UNITED MICROELECTRONICS CORP. 发明人 CHOU PO-FU;LIU YU-WEN
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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